Scanning X-ray Microscopy based on Kumakhov Optics and Raster Source
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Scanning X-ray Microscopy based on Kumakhov Optics and Raster Source

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Gelever V.D., Romanov A.Yu. Scanning X-ray Microscopy based on Kumakhov Optics and Raster Source // Proceedings of SPIE. – 2005. – V.5943. – P.313-317.